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ふるい分け、レーザー散乱・回折法および光学顕微鏡法との比較 測定方法による各項目の違い
| 動的画像解析法 (DIA) | 静的画像解析 | ふるい分け試験 (Retsch) |
レーザ回折・散乱法 (LD) | 動的光散乱法(DLS) | |
|---|---|---|---|---|---|
| Wide dynamic measurement range | ++ | - | + | ++ | + |
| Reproducibility and repeatability | ++ | + | + | ++ | + |
| High resolution for narrow distributions | ++ | ++ | - | + | + |
| Particle shape analysis | + | ++ | - | - | - |
| Direct measurement technique | ++ | ++ | + | - | - |
| Reliable detection of oversized grains | ++ | - | ++ | - | + |
| Robust hardware, easy operation for routine analysis | ++ | + | + | ++ | + |
| Analysis of individual particles | + | ++ | - | - | - |
| High measurement speed, short measurement times | ++ | - | - | ++ | + |
| Analysis of nano particles | - | - | - | + | ++ |
| Analysis of Zeta potential and molecular weight | - | - | - | - | ++ |
| Versatility | + | - | + | ++ | - |
| Measuring range | 0.8 µm - 135 mm | 0.5 µm – 1.5 mm | 10 µm - 125 mm | 10 nm – 5 mm | 0.8 nm - 6500 nm |